Showing results 3 to 5 of 5
Issue Date | Title | Author(s) |
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2022-03 | Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications | Lee, Kookjin; Ji, Hyunjin; Kim, Yanghee; Kaczer, Ben; Lee, Hyebin; Ahn, Jae-Pyoung; Choi, Junhee; Grill, Alexander; Panarella, Luca; Smets, Quentin; Verreck, Devin; Van Beek, Simon; Chasin, Adrian; Linten, Dimitri; Na, Junhong; Lee, Jae Woo; De Wolf, Ingrid; Kim, Gyu-Tae |
2021-04-16 | Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET | Lee, Kookjin; Kim, Yeonsu; Lee, Hyebin; Park, Sojeong; Lee, Yongwoo; Joo, Min-Kyu; Ji, Hyunjin; Lee, Jaewoo; Chun, Jungu; Sung, Moonsoo; Cho, Young-Hoon; Kim, Doyoon; Choi, Junhee; Lee, Jae Woo; Jeon, Dae-Young; Choi, Sung-Jin; Kim, Gyu-Tae |
2011-03-28 | Low-frequency noise in junctionless multigate transistors | Jang, Doyoung; Lee, Jae Woo; Lee, Chi-Woo; Colinge, Jean-Pierre; Montes, Laurent; Lee, Jung Il; Kim, Gyu Tae; Ghibaudo, Gerard |