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Showing results 4 to 6 of 6

Issue DateTitleAuthor(s)
1999-12Improvement of field-emission properties by formation of Nb-silicide layer on silicon-tip FEAsPark, J.S.; Lee, S.; Ju, B.K.; Oh, M.H.; Jang, J.; Jeon, D.
2020-08Low-temperature smoothing method of scalloped DRIE trench by post-dry etching process based on SF6 plasmaPark, J.S.; Kang, D.-H.; Kwak, S.M.; Kim, T.S.; Park, J.H.; Kim, T.G.; Baek, S.-H.; Lee, B.C.
2016-08Measurement errors of the EIT systems using a phantom and conductive yarnsPark, J.S.; Koo, S.-M.; Kim, C.H.
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