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Showing results 4 to 5 of 5

Issue DateTitleAuthor(s)
2023-04Nonlinear Lag Correction Based on the Autoregressive Model for Dynamic Flat-Panel DetectorsLee, Eunae; Kim, Dong Sik
1993-01Sizing Accuracy, Counting Efficiency, Lower Detection Limit and Repeatability of a Wafer Surface Scanner for Ideal and Real-World ParticlesBenjamin, Y.H.L.; Chae, S.-K.
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