Showing results 2 to 2 of 2
Issue Date | Title | Author(s) |
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2016-05 | Time-of-flight secondary ion mass spectrometry as a tool for evaluating the plasma-induced hydrogenation of graphene | Wallace, Joshua S.; Quinn, Austin; Gardella, Joseph A., Jr.; Hu, Jing; Kong, Eric Siu-Wai; Joh, Han-Ik |