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Showing results 4 to 4 of 4

Issue DateTitleAuthor(s)
2011-08-08Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stressKim, Bosul; Chong, Eugene; Kim, Do Hyung; Jeon, Yong Woo; Kim, Dae Hwan; Lee, Sang Yeol
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