Showing results 5 to 6 of 6
Issue Date | Title | Author(s) |
---|---|---|
1999-12-15 | Mechanism maps for electromigration-induced failure of metal and alloy interconnects | Andleigh, VK; Srikar, VT; Park, YJ; Thompson, CV |
2016-02-15 | Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes | Seo, Minah; Yamaguchi, Hisato; Mohite, Aditya D.; Boubanga-Tombet, Stephane; Blancon, Jean-Christophe; Najmaei, Sina; Ajayan, Pulickel M.; Lou, Jun; Taylor, Antoinette J.; Prasankumar, Rohit P. |