Showing results 14 to 18 of 18
Issue Date | Title | Author(s) |
---|---|---|
2011-08-08 | Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stress | Kim, Bosul; Chong, Eugene; Kim, Do Hyung; Jeon, Yong Woo; Kim, Dae Hwan; Lee, Sang Yeol |
2012 | Reduction of channel resistance in amorphous oxide thin-film transistors with buried layer | Chong, Eugene; Kim, Bosul; Lee, Sang Yeol |
2012-12 | Role of Si as carrier suppressor in amorphous Zn-Sn-O | Kang, IlJoon; Park, Chul Hong; Chong, Eugene; Lee, Sang Yeol |
2010-12-20 | Role of silicon in silicon-indium-zinc-oxide thin-film transistor | Chong, Eugene; Kim, Seung Han; Lee, Sang Yeol |
2011-07 | The relationship between processing parameters and the performance of novel amorphous silicon-indium-zinc oxide thin film transistors | Chong, Eugene; Kim, Seung Han; Cho, Eun Ah; Jang, Gun-Eik; Lee, Sang Yeol |