| 1998-01 | The investigations of dielectric and structural properties of polycrystalline BaTiO3 thin films on Pt substrates by RF magnetron sputtering | Jang, JW; Cho, WJ; Hahn, TS; Choi, SS; Chung, SJ |
| 1996-11-01 | Thickness dependence of crystalline orientation in YBa2Cu3Ox thin films grown by metalorganic chemical vapour deposition | Kang, WN; Kim, YH; Kim, CH; Jang, JW; Kim, IT; Choi, SS; Hahn, TS |
| 1997-05-01 | Thickness dependence of room temperature permittivity of polycrystalline BaTiO3 thin films by radio-frequency magnetron sputtering | Jang, JW; Chung, SJ; Cho, WJ; Hahn, TS; Choi, SS |
| 1996-09 | Thickness effects of SiOxNy interlayer inserted between BaTiO3 insulating layer and ZnS:Mn phosphor layer in thin film electroluminescent devices | Song, MH; Lee, YH; Hahn, TS; Oh, MH; Yoon, KH |
| 1997-09 | Transport properties of heavy-ion irradiated YBa2Cu3Ox thin films | Park, JH; Kim, DH; Shim, SY; Khim, ZG; Choi, SS; Hahn, TS; Hettinger, JD |
| 1997-06 | Use of a dielectric-loaded cylindrical cavity in measurements of the microwave surface resistances of high-T-c superconducting thin films | Lee, SY; Soh, BJ; Ahn, JW; Cho, JY; Park, BH; Jung, CS; Fedorov, VB; Denisov, AG; Kim, YH; Hahn, TS; Choi, SS; Oh, B; Moon, SH |
| 1999-08-01 | Vortex motion noise in YBa2Cu3Ox films before and after heavy-ion irradiation | Kim, DH; Gray, KE; Jukam, N; Miller, DJ; Kim, YH; Lee, JM; Park, JH; Hahn, TS |
| 1997-01 | White-light emitting thin-film electroluminescent device using micromachined structure | Lee, YH; Ju, BK; Song, MH; Kim, DK; Hahn, TS; Oh, MH |
