| 2001-12 | RuO2 sputtered thin film supercapacitor's performance as function of oxygen incorporation | Lim, JH; Choi, DJ; Cho, WI; Yoon, YS |
| 2001-10-01 | Solid-state thin-film supercapacitor with ruthenium oxide and solid electrolyte thin films | Yoon, YS; Cho, WI; Lim, JH; Choi, DJ |
| 1999-05-15 | The characteristics of interfacial strains developed in silicon by wet O-2 oxidation | Shin, DW; You, YH; Choi, DJ; Kim, GH |
| 2001-04 | The effect of input gas ratio on the growth behavior of chemical vapor deposited SiC films | Oh, JH; Oh, BJ; Choi, DJ; Kim, GH; Song, HS |
| 2002-12-02 | The microstructural effect of chemically vapor infiltrated SiC whiskered thin film on the green body of SiC/C composites | Lee, YJ; Hwang, SM; Choi, DJ; Park, SH; Kim, HD |
| 1999-06-01 | The stacking faults and their strain effect at the Si/SiO2 interfaces of a directly bonded SOI (silicon on insulator) | Shin, DW; Choi, DJ; Kim, GH |
| 2001-03 | Thin film supercapacitors using a sputtered RuO2 electrode | Lim, JH; Choi, DJ; Kim, HK; Cho, WI; Yoon, YS |
| 1997-11-15 | Tilt-axis effect on oxidation behaviour and capacitance-voltage characteristics of (100) silicon | Woo, HJ; Choi, DJ; Kim, GH |
