2006-12 | Stress development of direct-patternable PZT film for applying to micro-detecting system | Bae, Sang Woo; Kang, Ghi Yuun; Park, Hyung-Ho; Kim, Tae-Song |
1996-12-16 | Structural and ferroelectric properties of the c-axis oriented SrBi2Ta2O9 thin films deposited by the radio-frequency magnetron sputtering | Song, TK; Lee, JK; Jung, HJ |
2006-09 | The array growth of ferroelectric nanotubes in anodic porous alumina nanoholes on silicon | Min, Hyung-Seob; Jung, Seung-Won; Lee, Jeon-Kook |
2001-06-01 | The effect of ZrO2 buffer layer on electrical properties in Pt/SrBi2Ta2O9/ZrO2/Si ferroelectric gate oxide structure | Choi, HS; Kim, EH; Choi, IH; Kim, YT; Choi, JH; Lee, JY |
- | The Influence of Post-annealing on the Electrical Properties of Sol-gel Derived Bi3.15Nd0.85Ti3O12 Thin films | Jung, Sung Mok; Kim, Young Hwan; 홍석경; 유상임; Kim, Yong Tae |
2006-12 | Thickness dependent ferroelectric properties of BSTO thin films deposited by RF magnetron sputtering | Ha, Jong-Yoon; Choi, Ji-Won; Kang, Chong-Yun; Karmanenko, S. F.; Choi, Doo Jin; Yoon, Seok-Jin; Kim, Hyun-Jai |