Showing results 14 to 15 of 15
Issue Date | Title | Author(s) |
---|---|---|
- | ULSI interconnect failures due to electromigration-induced stress evolution: computer simulation study | PARK YOUNG JOON; Vaibhav K. Andleigh; Carl V. Thompson; 최인석; 주영창 |
2001-10 | 구리배선의 electromigration 신뢰성 | PARK YOUNG JOON |