Showing results 1 to 3 of 3
Issue Date | Title | Author(s) |
---|---|---|
2008-05-12 | Efficient suppression of charge trapping in ZnO-based transparent thin film transistors with novel Al2O3/HfO2/Al2O3 structure | Chang, Seongpil; Song, Yong-Won; Lee, Sanggyu; Lee, Sang Yeol; Ju, Byeong-Kwon |
2020-11-06 | Real-time effect of electron beam on MoS(2)field-effect transistors | Lee, Kookjin; Lee, Hyebin; Kim, Yanghee; Choi, Junhee; Ahn, Jae-Pyoung; Shin, Dong Hoon; Cho, Young-Hoon; Jang, Ho-kyun; Lee, Sang Wook; Shin, Jinwoo; Ji, Hyunjin; Kim, Gyu-Tae |
2012-04-30 | The charge trapping characteristics of Si3N4 and Al2O3 layers on amorphous-indium-gallium-zinc oxide thin films for memory application | Jung, Ji Sim; Rha, Sang-Ho; Kim, Un Ki; Chung, Yoon Jang; Jung, Yoon Soo; Choi, Jung-Hae; Hwang, Cheol Seong |