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Issue DateTitleAuthor(s)
2023-04Thermal degradation comparison of delta-doped GaAs tunnel junctions using Si and Te n-type dopantsMadarang, May Angelu; Chu, Rafael Jumar; Kim, Yeonhwa; Lung, Quang Nhat Dang; Ju, Eunkyo; Choi, Won Jun; Jung, Daehwan
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