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Issue DateTitleAuthor(s)
-Spectroscopic Ellipsometry and Raman Spectroscopy of Ge-doped SbTe Thin FilmsJun-Woo Park; Hosun Lee; Tae Dong Kang; Andrei Sirenko; Lee Hyun Seok; Lee Suyoun; Jeung-hyun Jeong; CHEONG, BYUNG KI
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