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Showing results 7 to 7 of 7

Issue DateTitleAuthor(s)
2018-07Two-Dimensional Thickness-Dependent Avalanche Breakdown Phenomena in MoS2 Field-Effect Transistors under High Electric FieldsPak, Jinsu; Jang, Yeonsik; Byun, Junghwan; Cho, Kyungjune; Kim, Tae-Young; Kim, Jae-Keun; Choi, Barbara Yuri; Shin, Jiwon; Hong, Yongtaek; Chung, Seungjun; Lee, Takhee
1

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