Showing results 3 to 3 of 3
Issue Date | Title | Author(s) |
---|---|---|
- | Investigation on the enhanced switching reliability of a non-volatile phase-change memory device with an oxidized TiN electrode | Dae-Hwan Kang; Kim Inho; Jeung-hyun Jeong; CHEONG, BYUNG KI; Dong-Ho Ahn; Dongbok Lee; Hyun-Mi Kim; Ki-Bum Kim |