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Showing results 6 to 10 of 10

Issue Date	Title	Author(s)
-	Microstructural analysis of in doped Ge-Sb-Te thin films using high voltage electron microscopy	Y. I. Kim; Eun Tae Kim; Jeong Yong Lee; Kim, Yong Tae
-	Microstructure alanysis of In-Sb-Te thin films deposited by RF magnetron sputtering	Kim Chung Soo; Eun Tae Kim; Jeong Yong Lee; Kim, Yong Tae
1994-01	Performance of the plasma deposited tungsten nitride barrier to prevent the interdiffusion of Al and Si.	이창우; 김용태; 이주천; Jeong Yong Lee; 민석기; 박영욱
-	Real Time Characterization of the Surface Degradation and Thermal Stability of Charged Ni-based Cathode Materials for Li-Ion Batteries	HWANG SOOYEON; Se Young Kim; Kim, Seung Min; Cho, Byung Won; Chung, Kyung Yoon; Jeong Yong Lee; Eric A. Stach; Chang, Won Young
-	Transmission electron microscopy study on crystallization and phase separation of Sb-Se-Te ternary alloys	Jong Moon Yoon; Eun Tae Kim; Jeong Yong Lee; Kim, Yong Tae

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