Showing results 14 to 16 of 16
Issue Date | Title | Author(s) |
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2009-11-30 | Observation of new critical point in InxAl1-xAs alloy using spectroscopic ellipsometry | Yoon, J. J.; Ghong, T. H.; Byun, J. S.; Kang, Y. J.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Song, J. D. |
2013-07-01 | Optical properties of AlAsxSb1-x alloys determined by in situ ellipsometry | Kim, J. Y.; Yoon, J. J.; Kim, T. J.; Kim, Y. D.; Lee, E. H.; Bae, M. H.; Song, J. D.; Choi, W. J.; Liang, C. -T.; Chang, Y. -C. |
2008-04-14 | Optical properties of InxAl1-xAs alloy films | Yoon, J. J.; Ghong, T. H.; Byun, J. S.; Kim, Y. D.; Aspnes, D. E.; Kim, H. J.; Chang, Y. C.; Song, J. D. |