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Showing results 17 to 34 of 34

Issue DateTitleAuthor(s)
-In-situ analysis on domain evolution of epitaxial PLT, PZT thin films using synchrotron XRDLEE KYEONG SEOK; 강영민; 백성기
-In-situ observation of 90˚-domain switching in epitaxial Pb(Zr,Ti)O3 thin films by synchrotron XRDLEE KYEONG SEOK; KIM YONG GWON; 김정; 정일섭; 백성기
-Microstructural characterization of epitaxial PbTiO ₃ thin films usig synchrotron X-ray diffractionLEE KYEONG SEOK; 백성기
-Microstructural properties of epitaxial PLZT thin films grown on various substrates by pulsed laser deposition.LEE KYEONG SEOK; 백성기
-Microstructure and electro-optic property of epitaxial (Pb,Sr)TiO₃ thin filmsKIM YONG GWON; LEE KYEONG SEOK; 백성기
-Microstructure and optical loss of epitaxial (Pb,Sr)TiO3 thin filmsKIM YONG GWON; LEE KYEONG SEOK; 백성기
-Microstructure and optical propagation in epitaxial (Pb,La)TiO ₃ thin films강영민; LEE KYEONG SEOK; 백성기
-Processing and microstructural characterization of epitaxial (Pb,Sr)TiO ₃ thin films.KIM YONG GWON; LEE KYEONG SEOK; 백성기
-Pulsed laser deposition of BST films for microwave phase shifterLEE KYEONG SEOK; 백성기
-Strain relaxation and domain formation in epitaxial PZT thin films.LEE KYEONG SEOK; 백성기
-Structural analysis of epitaxial (Pb,La)TiO3 thin films using synchrotron X-ray diffraction강영민; LEE KYEONG SEOK; 백성기
-Structural characterization of epitaxial PbTiO3 films grown on various single crystal substrates using synchrotron X-ray DiffractionLEE KYEONG SEOK; 백성기
-Structural characterization of epitaxial PLZT thin filmsLEE KYEONG SEOK; 백성기
-Structural characterization of ferroelectric domain formation in epitaxial PZT thin films by two-dimensional reciprocal space mapping using synchrotron x-ray diffractionLEE KYEONG SEOK; 백성기
-Synchrotron XRD study on domain formation of epitaxial PLZT thin filmsLEE KYEONG SEOK; 백성기
-Synchrotron XRD study on domain structure of epitaxial PLZT thin filmsLEE KYEONG SEOK; 백성기
-단결정 MgO(100) 기판에 증착한 백금 (Pt) 박막의 미세구조 .강영민; LEE KYEONG SEOK; 백성기
2007-06-25알루미늄이 증착된 폐 포장 필름의 재생 방법홍순만; 황승상; 백성기; 조봉규; 남영완

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