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Showing results 1 to 7 of 7

Issue DateTitleAuthor(s)
-CD Measurements of EUV Mask using a Coherent Scattering Microscope Mask Inspection ToolKim Yong Soo; Park June; 성하민; 김점술; 이승범; 조현우; Park, Min-Chul; Cho, Woon Jo; Kim, Yong Tae; 이주한; Jhon, Young Min
-Characteristic Analysis of Coherent EUV Light Source based on High-order Harmonic GenerationKim Yong Soo; Park June; Kim Younghee; 성하민; 김점술; 이승범; 조현우; Cho, Woon Jo; Kim, Yong Tae; 이주한; Jhon, Young Min
-Coherent EUV Light Source using a Gas Capillary based on High-order Harmonic GenerationPark Han Young; Kim Yong Soo; 성하민; 김점술; 이주한; Jhon, Young Min
-CSM(Coherent Scattering Microscope) system development for next generation EUV photomask inspection박한용; 김용수; 성하민; 김점술; 이승범; 조현우; 이주한; Kim, Yong Tae; Jhon, Young Min
-Development of a Coherent EUV Light Source for EUV Mask InspectionKim Yong Soo; Ahn Joonmo; 성하민; Cho, Woon Jo; Park, Min-Chul; 김점술; KIM, JAE HUN; Woo, Deok Ha; Lee, Seok; Ju Han LEE; Kim, Yong Tae; Jhon, Young Min
2012-06Ta2O5/SiO2를 이용한 고출력 광섬유 레이저의 펌프 LD 보호기용 반사형 필터 설계 및 제작성하민; 김재헌; 이석; 전영민
-(Undefined)박한용; 김용수; 김영희; 성하민; 김점술; 이주한; Park, Min-Chul; Jhon, Young Min

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