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Showing results 2 to 2 of 2

Issue DateTitleAuthor(s)
-Electron microscopy evidence for microsegregation in TbFe sputtered films for magneto-optical recording.M. J. Kim; J. S. Bow; R. W. Carpenter; KIM SOON GWANG; LEE SEH KWANG; KIM WON MOK; YOON JONG SHIK
1

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