| 2010-04 | A comparison of quantitative analysis for various matrix containing Fe/Ni by depth profiling of dynamic SIMS | 임원철; 이지혜; 이연희 |
| 2011-04 | A Quantitative Analysis for CIGS Thin Films by Dynamic Secondary Ion Mass Spectrometry | 임원철; 이지혜; 원성옥, et al |
| 2011-10 | A Study of Dynamic SIMS analysis of Cu(In Ga)Se2 (CIGS) | 임원철; 이지혜; 이연희 |
| 2007-09 | Adaptive Information Providing System for R&D Meeting Environments | 이상근; 이지혜; 박면웅 |
| 2009-05 | Analysis of 1,4-Dioxane by-product by photo decomposition use GC/MSD and HPLC | 이지혜; 임옥경; 한은정, et al |
| 2013-09 | Analysis of Natural Dyes in Archaeological Textiles using TOF-SIMS and other Analytical Techniques | 이지혜; 김만호; 이강봉, et al |
| 2014-11 | Analysis of natural dyes in archeological textiles using TOF-SIMS and other analytical techniques | 이지혜; 김만호; 이강봉, et al |
| 2008-03 | Applications of surface analytical techniques for organic materials in archaeology or forensic science | 이연희; 이지혜; 함승욱, et al |
| 2007-09 | Applications of TOF-SIMS for organic materials in archaeology and forensic sicence | 이연희; 이지혜; 김영수, et al |
| 2012-10 | Auger Electron Spectroscopy를 이용한 Cu(InGa)Se2 박막의 정량화 | 윤정현; 이지혜; 이연희 |
| 2013-09 | Characterization and Sequence Determination of Ball-point Pen Inks and Red Sealing-inks by TOF-SIMS and ATR FT-IR | 이지혜; 조윤정; 남윤식, et al |
| 2014-11 | Characterization and sequence determination of pen inks, red sealing inks, and laser toners by TOF-SIMS and ATR FTIR | 이지혜; 김선희; 조윤정, et al |
| 2012-06 | Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices | 임원철; 이지혜; 원성옥, et al |
| 2011-05 | Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry | 임원철; 이지혜; 원성옥, et al |
| 2010-10 | Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices by secondary ion mass spectrometry | 임원철; 이지혜; 이연희 |
| 2011-03 | Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry | 임원철; 이지혜; 이연희 |
| 2012-06 | Characterization of dyed textiles using TOF-SIMS and FT-IR | 이지혜; A. Ceglia; 김강진, et al |
| 2011-05 | Characterization of dyed textiles using TOF-SIMS with PCA | 이지혜; A. Ceglia; 김강진, et al |
| 2010-09 | Characterization of fluorocarbon fhin films deposited by ICP and PP | 이지혜; 김강진; 이연희 |
| 2011-03 | Characterization of fluorocarbon thin films deposited by ICP and PP | 이지혜; 김강진; 이연희 |
| 2013-01 | Characterization of microphase-separated diblock copolymer films by TOF-SIMS | 이지혜; 강민화; 임원철, et al |
| 2011-09 | Characterization of microphase-separated diblock copolymer films by TOF-SIMS | 이연희; 이지혜; 임원철, et al |
| 2013-04 | Characterization of Nanostructures in Blend and Copolymer films depend on Annealing Condition | 강민화; 이지혜; 이연희 |
| 2013-05 | Characterization of Natural Dyes and Traditional Korean Silk Fabric by Surface Analytical Techniques | 이지혜; 강민화; 이강봉, et al |
| 2013-10 | Characterization of Polymer Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) | 이연희; 이지혜 |
| 2012-10 | Characterization of surface structures of blending homopolymer and diblock copolymer films by AFM | 강민화; 이지혜; 이연희 |
| 2015-12 | Characterization of traditional Korean Lacquers using surface analytical techniques | 이지혜; 김민정; 김만호, et al |
| 2009-04 | Chemical composition and lead isotope ratio analysis for iron armor by SIMS | 이지혜; 이연희; 김강진 |
| 2008-10 | Comparision of conventional lacquer and cashew coatings by TOF-SIMS and XPS | 이지혜; 이연희; 함승욱, et al |
| 2014-11 | Comparison of nanostructured blend homopolymers and diblock copolymers by AFM and TOF-SIMS | 강민화; 이지혜; 이연희 |
