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Showing results 1 to 9 of 9

Issue DateTitleAuthor(s)
2012-12Performance Variation According to Device Structure and the Source/Drain Metal Electrode of a-IGZO TFTs라상호; 정지심; 정윤수, et al
2012-01Properties of Atomic Layer Deposited HfO2 Films on Ge Substrates Depending on Process Temperatures정형석; 김효겸; 유일혁, et al
2012-09Reduction of Charge Trapping in HfO2 Film on Ge Substrates by Atomic Layer Deposition of Various Passivating Interfacial Layers정형석; 유일혁; 김효겸, et al
2013-10Study on the defects in metal-organic chemical vapor deposited zinc tin oxide thin films using negative bias illumination stability analysis김언기; 라상호; 김정환, et al
2012-05The charge trapping characteristic of Si3N4 and Al2O3 layers on amorphous-indium-gallium-zinc oxide thin films for memory application정지심; 라상호; 김언기, et al
2013-03The Electrical Properties of Asymmetric Schottky Contact Thin-Film Transistors with Amorphous-In2Ga2ZnO7라상호; 김언기; 정지심, et al
2012-07The Impact of Carbon Concentration on the Crystalline Phase and Dielectric Constant of Atomic Layer Deposited HfO2 Films on Ge Substrate정형석; 전상호; 김효겸, et al
2012-05Vertically integrated submicron amorphous-In2Ga2ZnO7 thin film transistor using a low temperature process라상호; 정지심; 정윤수, et al
-(Undefined)롬바드, 앤서니; 롱, 우준; 뤼브라드 오케, et al