| 2011-07 | Effects of gate insulators on the performance of a-IGZO TFT fabricated at room-temperature | Chun, Yoon Soo; Chang, Seongpil; Lee, Sang Yeol |
| 2008-05-12 | Efficient suppression of charge trapping in ZnO-based transparent thin film transistors with novel Al2O3/HfO2/Al2O3 structure | Chang, Seongpil; Song, Yong-Won; Lee, Sanggyu; Lee, Sang Yeol; Ju, Byeong-Kwon |
| 2009-12-15 | Fabrication and characterization of Ga-doped ZnO nanowire gas sensor for the detection of CO | Kim, Kyoungwon; Song, Yong-Won; Chang, Seongpil; Kim, In-Ho; Kim, Sangsig; Lee, Sang Yeol |
| 2010-03 | High-Performance a-IGZO TFT With ZrO2 Gate Dielectric Fabricated at Room Temperature | Lee, Jae Sang; Chang, Seongpil; Koo, Sang-Mo; Lee, Sang Yeol |
| 2010-03-31 | Role of high-k gate insulators for oxide thin film transistors | Lee, Sang Yeol; Chang, Seongpil; Lee, Jae-Sang |
| 2010-06-14 | Scaling down of amorphous indium gallium zinc oxide thin film transistors on the polyethersulfone substrate employing the protection layer of parylene-C for the large-scale integration | Chang, Seongpil; Dong, Ki-Young; Park, Jung-Ho; Oh, Tae-Yeon; Kim, Jong-Woo; Lee, Sang Yeol; Ju, Byeong-Kwon |
| 2010-07 | Systematic investigation on the effect of contact resistance on the performance of a-IGZO thin-film transistors with various geometries of electrodes | Lee, Jae Sang; Chang, Seongpil; Bouzid, Houcine; Koo, Sang-Mo; Lee, Sang Yeol |
| 2010-09-01 | The effect of annealing on amorphous indium gallium zinc oxide thin film transistors | Bae, Hyeon-seok; Kwon, Jae-Hong; Chang, Seongpil; Chung, Myung-Ho; Oh, Tae-Yeon; Park, Jung-Ho; Lee, Sang Yeol; Pak, James Jungho; Ju, Byeong-Kwon |
