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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
-Measuring strength of VLS-grown Si nanowires: AFM bending vs. nanoindentationYong-Jae Kim; Kwangsoo Son; Jeung-hyun Jeong; Won Il Park; Jae-il Jang
-(Undefined)Byung-Gil Yoo; 오준학; Park Kyoung Won; Jae-Chul Lee; Jae-il Jang
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