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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2019-03Trapped charge modulation at the MoS2/SiO2 interface by a lateral electric field in MoS(2 )field-effect transistorsPak, Jinsu; Cho, Kyungjune; Kim, Jae-Keun; Jang, Yeonsik; Shin, Jiwon; Kim, Jaeyoung; Seo, Junseok; Chung, Seungjun; Lee, Takhee
2018-07Two-Dimensional Thickness-Dependent Avalanche Breakdown Phenomena in MoS2 Field-Effect Transistors under High Electric FieldsPak, Jinsu; Jang, Yeonsik; Byun, Junghwan; Cho, Kyungjune; Kim, Tae-Young; Kim, Jae-Keun; Choi, Barbara Yuri; Shin, Jiwon; Hong, Yongtaek; Chung, Seungjun; Lee, Takhee
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