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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2006-09-01An experimental investigation on the switching reliability of a phase change memory device with an oxidized TiN electrodeKang, Dae-Hwan; Kim, In Ho; Jeong, Jeung-hyun; Cheong, Byung-ki; Ahn, Dong-Ho; Lee, Dongbok; Kim, Hyun-Mi; Kim, Ki-Bum; Kim, Soo-Hyun
2010-01Enhanced thermal efficiency for amorphization in nano-structured Ge2Sb2Te5-TiOx filmsLee, Dongbok; Kang, Dongmin; Kwon, Min-Ho; Jun, Hyun-Goo; Kim, Ki-Bum; Lyeo, Ho-Ki; Lee, Hyun-Suk; Cheong, Byung-ki
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