Browsing byAuthorLim, KM

Jump to:
All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
  • Sort by:
  • In order:
  • Results/Page
  • Authors/Record:

Showing results 1 to 1 of 1

Issue DateTitleAuthor(s)
1999-05-10The effect of Al-Ta2O5 topographic interface roughness on the leakage current of Ta2O5 thin filmsKim, YS; Lee, YH; Lim, KM; Sung, MY

BROWSE