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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
2009-08-31A study on the temperature dependence of characteristics of phase change memory devicesLee, Suyoun; Jeong, Doo Seok; Jeong, Jeung-hyun; Zhe, Wu; Park, Young-Wook; Ahn, Hyung-Woo; Kim, Mok; Cheong, Byung-ki
2010-01-11A study on the temperature dependence of the threshold switching characteristics of Ge2Sb2Te5Lee, Suyoun; Jeong, Doo Seok; Jeong, Jeung-hyun; Zhe, Wu; Park, Young-Wook; Ahn, Hyung-Woo; Cheong, Byung-ki
2009-05Demonstration of a Reliable High Speed Phase-Change Memory Using Ge-Doped SbTeLee, Suyoun; Jeong, Jeung-hyun; Wu, Zhe; Park, Young-Wook; Kim, Won Mok; Cheong, Byung-ki
2010-03-29Improved stability of a phase change memory device using Ge-doped SbTe at varying ambient temperatureWu, Zhe; Lee, Suyoun; Park, Young-Wook; Ahn, Hyung-Woo; Jeong, Doo Seok; Jeong, Jeung-hyun; No, Kwangsoo; Cheong, Byung-ki
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