Browsing by Author Vaibhav K. Andleigh

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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
1999-12Mechanism maps for electromigration-induced failure of metal and alloy interconnectsVaibhav K. Andleigh; V. T. Srikar; 박영준, et al
1999-04Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects박영준; Vaibhav K. Andleigh; Carl V. Thompson
1998-09Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnectsVaibhav K. Andleigh; 박영준; Carl V. Thompson
2000-07ULSI interconnect failures due to electromigration-induced stress evolution: computer simulation study박영준; Vaibhav K. Andleigh; Carl V. Thompson, et al

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