Browsing byAuthorWoo, Deokha

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Showing results 1 to 11 of 11

Issue DateTitleAuthor(s)
2023-11Acoustic microscopy characterization of highly-ordered anodized nanoporous alumina films for nanotechnology applicationsDubey, Pooja; Declercq, Nico F.; Zhai, Min; Locquet, Alexandre; Jung, Mi; Woo, Deokha; Citrin, D. S.
2020-07Characterization of nanoporous Al2O3 films at terahertz frequenciesZhai, Min; Locquet, A.; Jung, Mi; Woo, Deokha; Citrin, D. S.
2021Characterization of nanoporous alumina using terahertz reflectometry and scattering imagingZhai, Min; Locquet, A.; Jung, Mi; Woo, Deokha; Citrin, D. S.
2012-07Enhanced Light Output from the Nano-Patterned InP Semiconductor Substrate Through the Nanoporous Alumina MaskJung, Mi; Kim, Jae Hun; Lee, Seok; Jang, Byung Jin; Lee, Woo Young; Oh, Yoo-Mi; Park, Sun-Woo; Woo, Deokha
2014-07-07Enhancement of hole injection and electroluminescence by ordered Ag nanodot array on indium tin oxide anode in organic light emitting diodeJung, Mi; Yoon, Dang Mo; Kim, Miyoung; Kim, Chulki; Lee, Taikjin; Kim, Jae Hun; Lee, Seok; Lim, Si-Hyung; Woo, Deokha
2016-08Localized surface plasmon resonance in two-dimensional silver nanodot array fabricated using nanoporous alumina mask for chemical sensor platformJung, Mi; Ji, Myung-Gi; Kim, Tae-Ryong; Shim, Cheol-Hwee; Lee, Seok; Woo, Deokha; Choi, Young-Wan
2016-01-04Manual, In situ, Real-Time Nanofabrication using Cracking through IndentationNam, Koo Hyun; Suh, Young D.; Yeo, Junyeob; Woo, Deokha
2007-07Nanohole arrays with sub-30 nm diameter formed on GaAs using nanoporous alumina maskJung, Mi; Lee, Seok; Jhon, Young Min; Mho, Sun-il; Cho, Jae-won; Woo, Deokha
2021-02Nondestructive characterization of nanoporous alumina films using terahertz scattering imagingZhai, Min; Locquet, A.; Jung, Mi; Woo, Deokha; Citrin, D. S.
2014-04Plasmonic Properties of Metal Nanodot Arrays with Same Diameter utilizing Nanoporous Alumina MaskJung, Mi; Kim, Chulki; Woo, Deokha; Kim, Jae Hun; Lee, Seok; Lee, Taikjin
2011-04Study of the Interaction Between Biomolecule Mono layers Using Total Internal Reflection EllipsometryJung, Yong Woo; Yoon, Jae Jin; Kim, Young Dong; Woo, Deokha

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