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Issue DateTitleAuthor(s)
2011-08-01Ultraviolet irradiation effect on the properties of leakage current and dielectric breakdown of low-dielectric-constant SiOC(-H) films using comb capacitor structureKim, Chang Young; Navamathavan, R.; Lee, Heang Seuk; Woo, Jong-Kwan; Hyun, Myung Taek; Lee, Kwang-Man; Jeung, Won Young; Choi, Chi Kyu
2011-09UV irradiation effects on the bonding structure and electrical properties of ultra low-k SiOC(-H) thin films for 45 nm technology nodeChoi, Chi Kyu; Kim, Chang Young; Navamathavan, R.; Lee, Heang Seuk; Woo, Jong-Kwan; Hyun, Myung Taek; Lee, Heon Ju; Jeung, Won Young
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