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Issue DateTitleAuthor(s)
2019-11A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS TechnologyXimenes, Augusto Ronchini; Padmanabhan, Preethi; Lee, Myung-Jae; Yamashita, Yuichiro; Yaung, Dun-Nian; Charbon, Edoardo
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