1994-10-15 | CRYSTALLIZATION OF AMORPHOUS-SILICON BY EXCIMER-LASER ANNEALING WITH A LINE-SHAPE BEAM HAVING A GAUSSIAN PROFILE | JHON, YH; KIM, DH; CHU, H; CHOI, SS |
1996-02-15 | Effect of creep stress on microstructure of a Ni-Cr-W-Al-Ti superalloy | Doh, JM; Yoo, KK; Baik, HK; Choi, J; Hur, SK |
2014-09 | Full Range Dielectric Characteristics of Calcium Copper Titanate Thin Films Prepared by Continuous Composition-Spread Sputtering | Kang, Hyo Min; Baek, Seung-Hyub; Song, Jong Han; Cho, Yong Soo; Choi, Ji-Won |
2021-01 | Role of Hydrogen and Temperature in Hydrogen Embrittlement of Equimolar CoCrFeMnNi High-entropy Alloy | Lee, Junghoon; Park, Hanji; Kim, Myeonghyun; Kim, Han-Jin; Suh, Jin-yoo; Kang, Namhyun |
2003-02 | Simple model for 1/f noise in polycrystalline silicon thin-film transistors | Han, I; Choi, WJ; Kim, HJ; Park, YJ; Cho, WJ; Lee, JI; Chovet, A; Brini, J |
2024-02 | Ultrastrong and ductile steel welds achieved by fine interlocking microstructures with film-like retained austenite | Moon, Joonoh; Bae, Gyuyeol; Jeong, Bo-Young; Shin, Chansun; Kwon, Min-Ji; Kim, Dong Ik; Choi, Dong-Jun; Lee, Bong Ho; Lee, Chang-Hoon; Hong, Hyun-Uk; Suh, Dong-Woo; Ponge, Dirk |