Showing results 1 to 4 of 4
Issue Date | Title | Author(s) |
---|---|---|
1991-05-15 | EFFECTS OF ELECTRON DEEP TRAPS ON GENERATION LIFETIME IN DENUDED ZONE OF N-TYPE SI WAFER | KIM, HS; KIM, EK; MIN, SK |
2004-07 | Electrical characterization of InAs/InP self-assembled quantum dots with InGaAs strain-relief layers | Kim, JS; Kim, EK; Hwang, H; Park, K; Yoon, E; Park, IW |
2006-06 | Electrical properties of InAs/InGaAs/GaAs quantum-dot infrared photodetectors | Kim, Jin Soak; Kim, Eun Kyu; Choi, Won Jun; Song, Jin Dong; Lee, Jung Il |
2022-05 | Toward Understanding Chalcopyrite Solar Cells via Advanced Characterization Techniques | Bae, Soohyun; Kim, Joo-Hyun; Lee, Hae-Seok; Min, Byoung Koun |