Browsing bySubjectLeakage current mechanism

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Issue DateTitleAuthor(s)
2012-12Effects of oxygen pressure on electrical properties of (Na0.5K0.5)NbO3 films grown on Pt/Ti/SiO2/Si substratesKim, Bo-Yun; Seong, Tae-Geun; Seo, In-Tae; Kim, Jin-Seong; Kang, Chong-Yun; Yoon, Seok-Jin; Nahm, Sahn

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