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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2019-07Round-robin test of medium-energy ion scattering for quantitative depth profiling of ultrathin HfO2/SiO2/Si filmsMin, Won Ja; Marmitt, Gabriel; Lyudmila Goncharova; Kenji Kimura; Torgny Gustafsson; Matt Copel; Jungkyu Ko; Hyung­Ik Lee; Sungho Lee; 채근화; Jaap van den Berg; Kagnwon Jung; Kyungsu Park; Igor Alencar; Grande, Pedro L.; Moon, DaeWon
-The study of formation processes of perovskite heteroepitaxial nanostructuresS.F. Karmanenko; D.A. Nikolaev; Oh, Young-Jei; V.I. Sakharov; I.T. Serenkov; O.V. Sinjukova
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