Browsing bySubjectMobility degradation factors

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Issue DateTitleAuthor(s)
2018-11-05Effects of series resistance and interface properties on the operation of AlGaN/GaN high electron mobility transistorsJeon, Dae-Young; Kim, Do-Kywn; Park, So Jeong; Koh, Yumin; Cho, Chu-Young; Kim, Gyu-Tae; Park, Kyung-Ho

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