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Issue Date | Title | Author(s) |
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2009-06-08 | Dielectric response of AlSb from 0.7 to 5.0 eV determined by in situ ellipsometry | Jung, Y. W.; Ghong, T. H.; Byun, J. S.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Shin, S. H.; Song, J. D. |