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Showing results 2 to 2 of 2

Issue DateTitleAuthor(s)
2022-03Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55nm BCD ProcessGramuglia, F.; Keshavarzian, P.; Kizilkan, E.; Bruschini, C.; Tan, S.S.; Tng, M.; Quek, E.; Lee, M.; Charbon, E.

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