| - | The characterization of MOSFET type photosenser for CMOS image sensor | K. S. Shin; K. K. Paek; Y. S. Lee; S. I. Kim; J. H. Park; LEE YUN HI; Ju Byeong Kwon |
| - | The characterization of the modified floating gate MOSFETs for photodetector | K. S. Shin; K. K. Paek; Y. S. Lee; LEE YUN HI; S. I. Kim; J. H. Park; Ju Byeong Kwon |
| 2015-08 | The Schottky barrier modulation at PtSi/Si interface by strain and structural deformation | Srivastava, Pooja; Shin, Mincheol; Lee, Kwang-Ryeol; Mizuseki, Hiroshi; Kim, Seungchul |
| 1989-01 | The shift of threshold voltage and subthreshold current curve in LDD MOSFET degraded under difference DC stress-biases. | 강광남; 이명복; 이정일 |
| 2014-02 | Thermal analysis of self-heating in saddle MOSFET devices | Oh, Hyun Gon; Jeong, Cherlhyun; Cho, Il Hwan |
| - | Thin body n- and p-GaAs FET on Si for CMOS integration | Shim Jae Phil; Ju, Gunwu; kim seong kwang; KIM HANSUNG; Sanghyeon Kim; Kim Hyung-jun |
| - | Wafer Bonging Process for III-V MOSFET and Monolithic 3D Integration on Si Substrates | Kim Hyung-jun; Sanghyeon Kim |
| 2007-07 | 탑 게이트 탄소나노튜브 트랜지스터 특성 연구 | 박용욱; 윤석진 |
