Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
---|---|---|
1993-01 | Sizing Accuracy, Counting Efficiency, Lower Detection Limit and Repeatability of a Wafer Surface Scanner for Ideal and Real-World Particles | Benjamin, Y.H.L.; Chae, S.-K. |
2023-05 | Smart Materials with Dual Functionality: Repeatable Damage-Detection and Self-Healing | 정성민; Jang, Han Gyeol; Jo, Jun Young; 김윤상; Lee, Doh C.; Kim, Jaewoo |