Showing results 1 to 4 of 4
Issue Date | Title | Author(s) |
---|---|---|
2001-10 | Effect of dopants on cobalt silicidation behavior at metal-oxide-semiconductor field-effect transistor sidewall spacer edge | 김종채; Yeong-Cheol Kim; 김병국 |
2002-08 | Effects of leveler on the trench filling during damascene copper plating | 이유용; 박영준; 이재봉; 조병원 |
1991-04 | Surface void nucleation under the power-law creep condition in an Al-3 at. pct Mg solid solution alloy | Lee, D.-H.; Shin, D.H.; Hong, K.T.; Nam, S.W. |
2021-04-01 | Void containing AlN layer grown on AlN nanorods fabricated by polarity selective epitaxy and etching method | So, B.; Lee, J.; Cheon, C.; Lee, J.; Choi, U.; Kim, M.; Song, J.; Chang, J.; Nam, O. |