Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Kwang Ryeol | - |
| dc.date.accessioned | 2024-01-13T02:00:44Z | - |
| dc.date.available | 2024-01-13T02:00:44Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/101137 | - |
| dc.language | English | - |
| dc.subject | MD simulation | - |
| dc.subject | surface | - |
| dc.subject | interface | - |
| dc.subject | semiconductor | - |
| dc.title | Atomic Scale Simulation of Interface and Surface Phenomena during Thin Film Growth | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | SISPAD 2009 | - |
| dc.citation.title | SISPAD 2009 | - |
| dc.citation.conferencePlace | US | - |
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