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dc.contributor.authorPhaniraj Madakashira-
dc.contributor.authorKim Dong-Ik-
dc.contributor.authorSHIM, JAE-HYEOK-
dc.contributor.authorCho, Young Whan-
dc.date.accessioned2024-01-13T03:33:15Z-
dc.date.available2024-01-13T03:33:15Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/102110-
dc.languageEnglish-
dc.subjectOxidation-
dc.subjectSOFC-
dc.subjectstainless steel-
dc.titleEffect of grain orientation on oxide scale formation in SOFC interconnect material-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation7th International Conference on the Microscopy of Oxidation-
dc.citation.title7th International Conference on the Microscopy of Oxidation-
dc.citation.conferencePlaceUK-
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