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dc.contributor.author하성도-
dc.contributor.author황인식-
dc.date.accessioned2015-12-02T04:53:14Z-
dc.date.available2015-12-02T04:53:14Z-
dc.date.issued199905-
dc.identifier.citation, 1086-1091-
dc.identifier.other11144-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/10220-
dc.publisher한국정밀공학회 '99 년도 춘계학술대회논문집-
dc.subject검사 계획-
dc.titleDevelopment of feature-based intelligent inspection planning system for CMM-
dc.typeConference Paper-
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