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TOF-SIMS Study of red sealing-inks on paper and its forensic applications

Authors

Lee Ji-hye; Chiwoo Lee; LEE, KANG BONG; LEE, YEON HEE

Citation

The 16th International conference on secondary ion mass spectrometry, pp.133

Keywords

Forensic science; document; sealing-inks; TOF-SIMS

URI

https://pubs.kist.re.kr/handle/201004/102896

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KIST Conference Paper > Others

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