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Dislocation related defect states in GaN irradiated with 1 MeV electron-beam

Authors

Dong Uk Lee; Lim-Kyoung Ha; Jin Soak Kim; KIM, EUN KYU; Eui Kwan Koh; Han, Il Ki

Citation

7th International Conference of Nitride Semiconductors, pp.21

Keywords

GaN; dislocation; defect; threading dislocation densities

URI

https://pubs.kist.re.kr/handle/201004/102917

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KIST Conference Paper > Others

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