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Medium Range Order in amorphous Ge2Sb2Te5 measured by fluctuation electron microscopy

Authors

Min-Ho Kwon; Bong-Sub Lee; Stephanie N. Bogle; John R. Abelson; Stephen G. Bishop; Simone Raoux; Heng Li; P. Craig Taylor

Citation

MRS 2006 spring meeting

Keywords

Ge2Sb2Te5; medium range order; fluctuation electron microscopy

URI

https://pubs.kist.re.kr/handle/201004/103992

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KIST Conference Paper > Others

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