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Tribological Properties of Nano/Micro-patterned PMMA Surfaces on Silicon Wafer

Authors

Yoon, Eui Sung; Singh, Arvind R.; Kong, Hosung; Kim, Byung Kyu; KIM, DEOK HO; Suh, Kahp Y.; Jeong, Hoon Eui

Citation

World Tribology Congress III, Washington D.C., USA, pp.1 - 2

Keywords

Nano; Micro; Tribology; PMMA; pattern; friction; adhesion

URI

https://pubs.kist.re.kr/handle/201004/105112

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KIST Conference Paper > Others

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